Energy Dispersive Spectroscopy (EDS) identifies the elements present in a sample by analyzing the X-rays generated by the electron beam of the Scanning Electron Microscope (SEM), making it an indispensable tool. Since X-rays are only generated from the area of the surface excited by the small electron beam, spectra of individual areas or particles can be obtained. Spectral information can therefore be generated for an entire field of view by scanning the beam, providing an elemental map. With the high count rate and excellent signal to noise ratio of our advanced SDD EDS detectors, high resolution data sets are collected and analyzed in minutes, rather than days. This elemental mapping technique allows our clients to immediately visualize the chemical landscape in their samples. Additionally, since the entire spectra is stored for each pixel, areas of interest that are identified later can be examined in detail, without ever having to re-image the sample. Other labs can’t touch the quality and visual impact of the elemental maps we produce here at MicroVision Labs.
- Several phases or elements of interest can be easily mapped in a single image
- Full spectral indexing of data can be saved for later computational analysis, allowing for re-examination of sample parameters
- Images with elemental data can be used to develop fractional and compositional analysis for quantitative examination.
- Elemental mapping highlights inclusions or aberrations in the sample matrix, showing the nature of any suspect materials
- Competitive rates