Research & Development
By overlaying the EDS elemental data on the corresponding SEM image, our new EDS detectors can rapidly produce vivid color elemental maps. The colors on the map represent the elemental make-up of the imaged area. This allows one to quickly and easily interpret the components present in the sample. Save a thousand words and use one of these pictures in your next project.
Energy Dispersive X-Ray Spectroscopy (EDS)
The EDS detector identifies the elements within a sample while it is being examined with a Scanning Electron Microscope (SEM). This ability allows an analyst to determine the elemental make-up of minute particles in a matter or seconds. EDS has an almost unlimited number of applications and makes the SEM the most powerful and versatile analytical tool around today. When you need to know what’s in your sample, give us a call.
Light Microscopy/Polarized Light Microscopy (PLM)
Light microscopy allows for the examination of optical and structural properties of a variety of samples. Optical properties such as polarization and birefringence help to differentiate between fibers, minerals, ceramics, biological materials and opaque materials including paints, coatings and metallic particles. This allows a wide range of particles to be quickly and effectively identified and quantified by an experienced analyst.
Nomarski/Differential Interference Contrast (DIC) Imaging
Translucent or transparent coatings on metallic or semi-conductor substrates are very difficult to image due to their reflective nature. Nomarski/DIC imaging is an effective method for accentuating differences in thickness, density or the optical index in these cases. This analysis enhances and highlights subtle features with brilliant color gradients and captures them with a high resolution digital imaging system. Let us bring out your sample’s hidden features.
Scanning Electron Microscopy (SEM)
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why.
X-Ray Imaging (Industrial)
X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects.